PH40695: DYNAMIC TEST RUNNER INTERNAL DEFECTS AND ENHANCEMENTS

Obtain the fix for this APAR.

APAR status

• Closed as program error.

Error description

• Dynamic Test Runner internal defects and enhancements
  

Local fix

Problem summary

• ****************************************************************
  * USERS AFFECTED: 01.CICS users recording transactions in a    *
  *                    CICSplex.                                 *
  *                 02.Users with PL/I programs that use the PCB *
  *                    DL/I call in CICS.                        *
  *                 03.Users with non-LE assembler programs that *
  *                    invoke the EXEC CICS RETURN API.          *
  ****************************************************************
  * PROBLEM DESCRIPTION: 01.z/VTP CICSplex routing may           *
  *                         fail to route the transaction        *
  *                         under test to the appropriate        *
  *                         region or may cancel the             *
  *                         transaction altogether.              *
  *                      02.ABEND S0C4 abend may occur           *
  *                         during replay of PL/I                *
  *                         programs that use the "PCB"          *
  *                         DL/I call to schedule a PSB          *
  *                         in CICS.                             *
  *                      03.ABEND S0C1 may occur on              *
  *                         replay of the non-LE program         *
  *                         when the Dynamic Test Runner         *
  *                         return from the simulated            *
  *                         EXEC CICS RETURN API call.           *
  ****************************************************************
  01.z/VTP's routing routine does not properly manage the
     SYNCONRETURN option, which in some cases leads to improper
     routing of transactions after VTP recording has been enabled
     in a CICSplex.
  02.The Dynamic Test Runner does not properly handle the argument
     list passed to PLIDTLI for the "PCB" DLI call. An extra level
     of indirection is inserted and can result in attempts to
     access undefined or protected storage.
  03.The Dynamic Test Runner can mistakenly identify non-LE
     assembler programs as another program type, which confuses
     the logic for return from the CICS RETURN. This causes the
     runner to execute code not on the ordinary return path.
  

Problem conclusion

• 01.z/VTP will attempt to route transactions using SYNCONRETURN
     first. If this fails, z/VTP will route the transaction
     without the SYNCONRETURN keyword.
  02.Dynamic Test Runner was updated to properly handle PL/I
     callers of the "PCB" DLI call.
  03.Dynamic Test Runner was updated to properly identify non-LE
     assembler programs during replay.
  

Temporary fix

Comments

APAR Information

• APAR is sysrouted FROM one or more of the following:

• APAR is sysrouted TO one or more of the following:

  UI79491

Modules/Macros

• BZU1SMPE BZU2EXEC BZU2LAYR BZU2THIN BZU2TLYR BZU3ALOC BZU6DDEF
  BZUACAF@ BZUACP   BZUADSMF BZUAEIN@ BZUAETR@ BZUAINIT BZUAIP2
  BZUAIPI  BZUAIPS  BZUAIPX  BZUALLOC BZUAPIPI BZUAPRC2 BZUAPRCA
  BZUAPRCD BZUAPRCX BZUAPRH@ BZUAPRS@ BZUARGID BZUARRS@ BZUARSMF
  BZUARST0 BZUARST1 BZUARST2 BZUARST3 BZUARST4 BZUARST5 BZUARST6
  BZUARST7 BZUARST8 BZUARST9 BZUASSRT BZUASTB0 BZUASTB1 BZUASTB2
  BZUASTB3 BZUASTB4 BZUASTB5 BZUASTB6 BZUASTB7 BZUASTB8 BZUASTB9
  BZUASTC0 BZUASTC1 BZUASTC2 BZUASTC3 BZUASTC4 BZUASTC5 BZUASTC6
  BZUASTC7 BZUASTC8 BZUASTC9 BZUASTMD BZUASTMP BZUASTUB BZUASTUC
  BZUAVRDT BZUBATCH BZUBCON@ BZUBCP   BZUBDSC@ BZUBSRV@ BZUCBCBL
  BZUCBPL1 BZUCCDFN BZUCCINT BZUCCOLL BZUCDEFN BZUCF410 BZUCF420
  BZUCF510 BZUCF520 BZUCF530 BZUCF540 BZUCF550 BZUCF560 BZUCI410
  BZUCI420 BZUCI510 BZUCI520 BZUCI530 BZUCI540 BZUCI550 BZUCI560
  BZUCICPT BZUCICSA BZUCICSL BZUCICSN BZUCICSS BZUCICST BZUCICSW
  BZUCICSX BZUCIDFN BZUCIDRI BZUCIDRP BZUCIDRR BZUCIDRS BZUCIDRT
  BZUCO410 BZUCO420 BZUCO510 BZUCO520 BZUCO530 BZUCO540 BZUCO550
  BZUCO560 BZUCPLTI BZUCPLTS BZUCPLTT BZUCRECS BZUCRECT BZUCSD
  BZUCSTUB BZUDB2PP BZUDB2PV BZUDB2ST BZUDCP   BZUDLAYR BZUDTHIN
  BZUDTLYR BZUDYNAL BZUECP   BZUESPIE BZUESPR@ BZUESTAE BZUGTARG
  BZUGTMEM BZUHFIO@ BZUHFIOH BZUHFIOP BZUHPRN@ BZUII410 BZUII420
  BZUII510 BZUII520 BZUII530 BZUII540 BZUII550 BZUII560 BZUIMSSB
  BZUIMSSE BZUIMSSF BZUIMSTR BZUIMSVN BZUIMSVR BZUINCL  BZUIO410
  BZUIO420 BZUIO510 BZUIO520 BZUIO530 BZUIO540 BZUIO550 BZUIO560
  BZUISVI0 BZUITERC BZUITERP BZUJFIOH BZUJFIOP BZUKFIO@ BZUKFIOH
  BZUKFIOP BZULCEE  BZULDB2  BZULEOPT BZULFIOH BZULFIOP BZULIMS
  BZULLE   BZULMQ   BZUMCP   BZUMETA  BZUMSGEN BZUPBCP  BZUPBMP
  BZUPDB2  BZUPDCP  BZUPDLI  BZUPECP  BZUPLAY  BZUPMCP  BZUPPLAY
  BZUPRH00 BZUPRH0@ BZURCP   BZURI410 BZURI420 BZURI510 BZURI520
  BZURI530 BZURI540 BZURI550 BZURI560 BZURO410 BZURO420 BZURO510
  BZURO520 BZURO530 BZURO540 BZURO550 BZURO560 BZURPLAY BZURRCP
  BZURTCP  BZURUN   BZUSCFG  BZUSCP   BZUSETUP BZUSLAYR BZUSTLYR
  BZUSUDSN BZUSYSIN BZUTCP   BZUTRACE BZUUFIOH BZUUFIOP BZUUMODC
  BZUUMODD BZUUMODI BZUUMODL BZUVERS  BZUVFIOH BZUVFIOP BZUVRM
  BZUVSAM  BZUWFIOH BZUWFIOP BZUXC410 BZUXC420 BZUXC510 BZUXC520
  BZUXC530 BZUXC540 BZUXC550 BZUXC560 BZUXCOLL BZUZFIO@ BZUZFIOH
  

Fix information

• Fixed component name

  VIRT TEST PLTFM

• Fixed component ID

  5724T0763

Applicable component levels

• R100 PSY UI79491

     UP22/03/01 P F202

Fix is available

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